Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6710610 | Socket for testing of semiconductor device, and semiconductor device and method of manufacturing the semiconductor device | Naotaka Tanaka, Hiroyuki Ohta, Ichiro Anjoh, Akio Hasebe, Kenichi Yamamoto | 2004-03-23 |