RM

Ryoichi Matsuoka

SI Seiko Instruments: 2 patents #39 of 192Top 25%
📍 Yotsukaido, JP: #2 of 8 inventorsTop 25%
Overall (2004): #42,951 of 270,089Top 20%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6757875 Method and apparatus of evaluating layer matching deviation based on CAD information — 2004-06-29
6724929 Wafer inspecting apparatus — 2004-04-20