Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6673657 | Kill index analysis for automatic defect classification in semiconductor wafers | Ariel Ben-Porath | 2004-01-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6673657 | Kill index analysis for automatic defect classification in semiconductor wafers | Ariel Ben-Porath | 2004-01-06 |