FF

Farshid Farrokhnia

GE: 1 patents #645 of 2,468Top 30%
📍 Brookfield, WI: #12 of 49 inventorsTop 25%
🗺 Wisconsin: #804 of 3,158 inventorsTop 30%
Overall (2004): #225,638 of 270,089Top 85%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6694047 Method and apparatus for automated image quality evaluation of X-ray systems using any of multiple phantoms Kenneth Scott Kump, Richard Aufrichtig, Alexander Y. Tokman 2004-02-17