Issued Patents 2004
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6798276 | Reduced potential generation circuit operable at low power-supply potential | Katsuhiro Mori, Jun Ohno | 2004-09-28 |
| 6778451 | Semiconductor memory device for masking all bits in a test write operation | Yoshitaka Takahashi, Hitoshi Ikeda | 2004-08-17 |
| 6759866 | Semiconductor integrated circuit and a testing method thereof | Katsuhiro Mori | 2004-07-06 |
| 6754126 | Semiconductor memory | Shusaku Yamaguchi, Toshiya Uchida, Yoshimasa Yagishita, Yoshihide Bando, Masahiro Yada +4 more | 2004-06-22 |
| 6735141 | Semiconductor memory device having an SRAM and a DRAM on a single chip | Hitoshi Ikeda, Akihiro Funyu, Takaaki Suzuki, Masao Taguchi, Kimiaki Satoh +1 more | 2004-05-11 |
| 6731553 | Memory circuit having compressed testing function | Waichiro Fujieda, Kota Hara | 2004-05-04 |
| 6724675 | Semiconductor memory device and electronic apparatus | Akihiro Funyu, Hitoshi Ikeda, Takaaki Suzuki, Masao Taguchi, Kimiaki Satoh +2 more | 2004-04-20 |
| 6721910 | Semiconductor memory improved for testing | Kazuhiro Ninomiya, Yasuharu Sato | 2004-04-13 |
| 6700816 | Semiconductor storage device conducting a late-write operation and controlling a test read-operation to read data not from a data latch circuit but from a memory core circuit regardless | Yoshitaka Takahashi, Hitoshi Ikeda | 2004-03-02 |
| 6683491 | Semiconductor integrated circuit | Toru Koga, Katsuhiro Mori | 2004-01-27 |