Issued Patents 2004
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6822529 | Integrated circuit interconnect system | — | 2004-11-23 |
| 6816031 | Adjustable delay transmission line | — | 2004-11-09 |
| 6812691 | Compensation for test signal degradation due to DUT fault | — | 2004-11-02 |
| 6798225 | Tester channel to multiple IC terminals | — | 2004-09-28 |
| 6784677 | Closed-grid bus architecture for wafer interconnect structure | John M. Long | 2004-08-31 |
| 6784674 | Test signal distribution system for IC tester | — | 2004-08-31 |
| 6686754 | Integrated circuit tester with high bandwidth probe assembly | — | 2004-02-03 |
| 6680659 | Integrated circuit interconnect system | — | 2004-01-20 |
| 6678850 | Distributed interface for parallel testing of multiple devices using a single tester channel | Richard S. Roy | 2004-01-13 |