Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6768324 | Semiconductor device tester which measures information related to a structure of a sample in a depth direction | Keizo Yamada, Tohru Tsujide, Yousuke Itagaki | 2004-07-27 |
| 6753194 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2004-06-22 |
| 6711453 | Production managing system of semiconductor device | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2004-03-23 |
| 6683308 | Method and apparatus for measuring thickness of thin film | Yosuke Itagaki, Keizo Yamada | 2004-01-27 |