Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816803 | Method of optical pyrometry that is independent of emissivity and radiation transmission losses | Patrick Joseph Nystrom | 2004-11-09 |
| 6799137 | Wafer temperature measurement method for plasma environments | Charles W. Schietinger | 2004-09-28 |