Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6803960 | Optical test structure for measuring charge-transfer efficiency | John P. Shepherd | 2004-10-12 |
| 6794219 | Method for creating a lateral overflow drain, anti-blooming structure in a charge coupled device | Hung Q. Doan | 2004-09-21 |
| 6730899 | Reduced dark current for CMOS image sensors | Robert M. Guidash | 2004-05-04 |
| 6693671 | Fast-dump structure for full-frame image sensors with lod antiblooming structures | William DesJardin | 2004-02-17 |