Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6809527 | METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR, A SENSOR CHARACTERISTIC MEASURING APPARATUS, A CAPACITIVE TYPE OF SENSOR APPARATUS, AND AN IC CHIP FOR MEASURING A SENSOR CHARACTERISTIC | Seiichiro Ishio, Yasutoshi Suzuki, Hajime Ito, Yasuaki Makino, Norikazu Ohta +1 more | 2004-10-26 |
| 6802222 | Diaphragm-type semiconductor device and method for manufacturing diaphragm-type semiconductor device | Seiichiro Ishio, Yasutoshi Suzuki, Keiichi Shimaoka | 2004-10-12 |