Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836567 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron Walleck | 2004-12-28 |
| 6798515 | Method for calculating a scale relationship for an imaging system | Ivan Bachelder | 2004-09-28 |
| 6798925 | Method and apparatus for calibrating an image acquisition system | — | 2004-09-28 |
| 6751361 | Method and apparatus for performing fixturing in a machine vision system | — | 2004-06-15 |