| 1 |
Sidney White |
Essilor International (Compagnie Generale D'Optique) |
3 |
| 1 |
Michael W. Rawlins |
Parkervision |
3 |
| 1 |
Haodong Li |
Human Genome Sciences |
3 |
| 1 |
Harold W. Aesch, Jr. |
— |
3 |
| #5 |
Robert W. Beckwith |
Sencorp Systems |
2 |
| #5 |
George P. Bortnyk |
RTX (Raytheon) |
2 |
| #5 |
Eldridge R. Byron |
Square D |
2 |
| #8 |
William H. Venz |
Paradyne |
1 |
| #8 |
Paul C. Atwell |
Faro Technologies |
1 |
| #8 |
Orlando Perez |
Faro Technologies |
1 |
| #8 |
Qiping Shen |
Alcon Refractiveshorizons |
1 |
| #8 |
Phillip G. Landers |
In-Situ |
1 |
| #8 |
William S. Larisey, Jr. |
Hill-Rom Services |
1 |
| #8 |
Edmund L. Badyna |
— |
1 |
| #8 |
William A. Corzo |
— |
1 |
| #8 |
Anthony Ingenoso |
IBM |
1 |
| #8 |
Richard Edwin Arndt |
Intervoice Limited Partnership |
1 |
| #8 |
David E. Dieska |
Intermec Ip |
1 |
| #8 |
Dean M. Eaton |
— |
1 |
| #8 |
Theodore Heeren |
Paradyne |
1 |
| #8 |
Thomas G. Legare, III |
Hazard Control Technologies |
1 |
| #8 |
Horst Riese |
— |
1 |
| #8 |
Vernon F. Marsh |
Honeywell |
1 |
| #8 |
Frank Gossett |
Semiconductor Diagnostics |
1 |
| #8 |
George P. Hendricks |
— |
1 |
| #8 |
John W. Host |
Oasis Co. |
1 |
| #8 |
Harry T. Gaines |
Ensco |
1 |
| #8 |
John E. Sumter |
Dart Industries |
1 |
| #8 |
Larry D. Mattingly |
Texon Lp |
1 |
| #8 |
Norikazu Inaba |
Mitsubishi Hitachi Power Systems |
1 |
| #8 |
Lawrence C. Langebrake |
University Of South Florida |
1 |
| #8 |
Chuck Coston |
Paradyne |
1 |
| #8 |
Wayne Edwards |
Freeescale Semiconductor |
1 |
| #8 |
Nathaniel R. Quick |
Usf Filtration And Separations Group |
1 |
| #8 |
Raymond T. Westfall |
Eclipse Energy Systems |
1 |
| #8 |
Delroy J. Sowada |
Honeywell |
1 |
| #8 |
Jeffrey W. Wockenfuss |
— |
1 |
| #8 |
Julius Mekwinski |
— |
1 |
| #8 |
Sheila Tatman |
Essilor International (Compagnie Generale D'Optique) |
1 |
| #8 |
Ken Steffey |
Faro Technologies |
1 |
| #8 |
Jon K. Holman |
Kinetrics |
1 |