Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6694466 | Method and system for improving the test quality for scan-based BIST using a general test application scheme | Huan-Chih Tsai, Sudipta Bhawmik | 2004-02-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6694466 | Method and system for improving the test quality for scan-based BIST using a general test application scheme | Huan-Chih Tsai, Sudipta Bhawmik | 2004-02-17 |