Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6747445 | Stress migration test structure and method therefor | Vivian W. Ryan | 2004-06-08 |
| 6683465 | Integrated circuit having stress migration test structure and method therefor | Vivian W. Ryan | 2004-01-27 |