Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6812047 | Evaluating a geometric or material property of a multilayered structure | Jiping Li | 2004-11-02 |
| 6812717 | Use of a coefficient of a power curve to evaluate a semiconductor wafer | Regina G. Nijmeijer, Beverly Klemme | 2004-11-02 |