Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6784685 | Testing vias and contacts in an integrated circuit | Tai-An Chao, Shihcheng Hsueh | 2004-08-31 |
| 6727710 | Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits | Jan Lodewijk de Jong | 2004-04-27 |