Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6806191 | Semiconductor device with a copper line having an increased resistance against electromigration and a method of forming the same | Christian Zistl, Jörg Hohage, Hartmut Rülke | 2004-10-19 |
| 6716650 | Interface void monitoring in a damascene process | Eckhard Langer, Frank Koschinsky, Volker Kahlert | 2004-04-06 |