Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6798230 | Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices | Jay CHAN, Eugene Zhao | 2004-09-28 |
| 6762613 | Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material | Huade Walter Yao | 2004-07-13 |