Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816249 | High throughput brightfield/darkfield wafer inspection system using advanced optical techniques | Christopher R. Fairley, Tao-Yi Fu, Bin-Ming Benjamin Tsai | 2004-11-09 |
| 6785443 | Optical fiber Bragg grating tuning device | Alexis Mendez, Mario Pacheco, Steve Montesanto, William Wang, Jason Zweiback | 2004-08-31 |