DI

Donald P. Richmond, II

AS Aehr Test Systems: 1 patents #1 of 7Top 15%
📍 Palo Alto, CA: #350 of 926 inventorsTop 40%
🗺 California: #8,555 of 28,370 inventorsTop 35%
Overall (2004): #231,504 of 270,089Top 90%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6682945 Wafer level burn-in and electrical test system and method John Hoang, Jerzy Lobacz 2004-01-27