YK

Yoshihito Kobayashi

AD Advantest: 1 patents #26 of 90Top 30%
Overall (2004): #82,644 of 270,089Top 35%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6728652 Method of testing electronic components and testing apparatus for electronic components 2004-04-27