Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791389 | Variable delay circuit and a testing apparatus for a semiconductor circuit | Hiroyuki Mikami | 2004-09-14 |
| 6768360 | Timing signal generation circuit and semiconductor test device with the same | — | 2004-07-27 |