HY

Hiroaki Yamoto

AD Advantest: 3 patents #14 of 90Top 20%
🗺 California: #2,168 of 28,370 inventorsTop 8%
Overall (2004): #28,007 of 270,089Top 15%
3
Patents 2004

Issued Patents 2004

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6791316 High speed semiconductor test system using radially arranged pin cards Rochit Rajsuman 2004-09-14
6678643 Event based semiconductor test system James Alan Turnquist, Shigeru Sugamori 2004-01-13
6678645 Method and apparatus for SoC design validation Rochit Rajsuman 2004-01-13