SF

Stacy Firth

YD Yield Dynamics: 1 patents #1 of 2Top 50%
🗺 Texas: #2,449 of 8,709 inventorsTop 30%
Overall (2003): #115,919 of 273,478Top 45%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6643596 System and method for controlling critical dimension in a semiconductor manufacturing process W. Jarrett Campbell 2003-11-04