YL

Yu-Yiu Lin

UM United Microelectronics: 1 patents #99 of 384Top 30%
Overall (2003): #84,165 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6583641 Method of determining integrity of a gate dielectric Mu-Chun Wang, Shih-Chieh Kao 2003-06-24