Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6658615 | IC with IP core and user-added scan register | — | 2003-12-02 |
| 6646460 | Parallel scan distributors and collectors and process of testing integrated circuits | — | 2003-11-11 |
| 6643810 | Integrated circuits carrying intellectual property cores and test ports | — | 2003-11-04 |
| 6636076 | Quad state logic design methods, circuits, and systems | — | 2003-10-21 |
| 6611934 | Boundary scan test cell circuit | — | 2003-08-26 |
| 6594789 | Input data capture boundary cell connected to target circuit output | — | 2003-07-15 |
| 6590225 | Die testing using top surface test pads | Richard L. Antley | 2003-07-08 |
| 6560734 | IC with addressable test port | — | 2003-05-06 |
| 6519729 | Reduced power testing with equally divided scan paths | — | 2003-02-11 |