Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6631344 | Method and system for performing deterministic analysis and speculative analysis for more efficient automatic test pattern generation | Thomas W. Williams | 2003-10-07 |
| 6615380 | Dynamic scan chains and test pattern generation methodologies therefor | Denis Martin, Thomas W. Williams | 2003-09-02 |