XS

Xin Song

II Inspex Incorporated: 1 patents #1 of 4Top 25%
📍 San Jose, CA: #929 of 2,756 inventorsTop 35%
🗺 California: #8,996 of 28,521 inventorsTop 35%
Overall (2003): #89,883 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6643006 Method and system for reviewing a semiconductor wafer using at least one defect sampling condition Chin-Jung Hsu, Arnold Cheng 2003-11-04