YS

Yoshiteru Shikakura

SI Seiko Instruments: 1 patents #87 of 247Top 40%
Overall (2003): #85,753 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6596992 Method of operating scanning probe microscope Kazunori Ando, Kazutoshi Watanabe, Masaki Tsuchihashi, Takehiro Yamaoka 2003-07-22