Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6593737 | Method for measuring the wall thickness of an electrically conductive object | Mark Theodoor Looljer, Johan van der Steen | 2003-07-15 |
| 6570379 | Method for inspecting an object of electrically conducting material | Mark Theodoor Looijer, Johan van der Steen | 2003-05-27 |
| 6538435 | Method for detecting an anomaly in an object of electrically conductive material along first and second direction at inspection points | Mark Theodoor Looijer, Johan van der Steen | 2003-03-25 |