Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642512 | Focused ion beam apparatus | — | 2003-11-04 |
| 6544692 | Black defect correction method and black defect correction device for photomask | Osamu Takaoka | 2003-04-08 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642512 | Focused ion beam apparatus | — | 2003-11-04 |
| 6544692 | Black defect correction method and black defect correction device for photomask | Osamu Takaoka | 2003-04-08 |