Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6573742 | Semiconductor integrated circuit with test points inserted thereinto | — | 2003-06-03 |
| 6546511 | Apparatus and method for parallel testing of multiple functional blocks of an integrated circuit | Eun-seok Chae | 2003-04-08 |