Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6658612 | Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modes | Sang-Seok Kang, Jong-Hyun Choi | 2003-12-02 |