Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646461 | Method and apparatus for testing semiconductor devices using improved testing sequence | Katsuya Furue | 2003-11-11 |
| 6586823 | Semiconductor device that can have a defective bit found during or after packaging process repaired | Ryuji Ohmura | 2003-07-01 |
| 6584592 | Semiconductor testing apparatus for testing semiconductor device including built in self test circuit | Ryuji Omura, Mari Shibayama | 2003-06-24 |