Issued Patents 2003
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661839 | Method and device for compressing and expanding data pattern | Takahiro Yamaguchi, Marco Tilgner | 2003-12-09 |
| 6653663 | Nitride semiconductor device | — | 2003-11-25 |
| 6649494 | Manufacturing method of compound semiconductor wafer | Satoshi Tamura, Masahiro Ogawa, Masaaki Yuri | 2003-11-18 |
| 6621860 | Apparatus for and method of measuring a jitter | Takahiro Yamaguchi, Mani Soma | 2003-09-16 |
| 6617182 | Semiconductor device and semiconductor substrate, and method for fabricating the same | Shinji Nakamura, Kenji Orita, Osamu Imafuji, Masaaki Yuri | 2003-09-09 |
| 6598004 | Jitter measurement apparatus and its method | Takahiro Yamaguchi, Mani Soma | 2003-07-22 |
| 6593765 | Testing apparatus and testing method for semiconductor integrated circuit | Takahiro Yamaguchi, Yoshihiro Hashimoto | 2003-07-15 |
| 6593159 | Semiconductor substrate, semiconductor device and method of manufacturing the same | Tadao Hashimoto, Osamu Imafuji, Masaaki Yuri | 2003-07-15 |
| 6594595 | Apparatus for and method of measuring cross-correlation coefficient between signals | Takahiro Yamaguchi, Mani Soma | 2003-07-15 |
| 6589857 | Manufacturing method of semiconductor film | Masahiro Ogawa, Daisuke Ueda | 2003-07-08 |
| 6569238 | Apparatus and method for depositing semi conductor film | — | 2003-05-27 |
| 6566231 | Method of manufacturing high performance semiconductor device with reduced lattice defects in the active region | Masahiro Ogawa, Kenji Orita, Shinji Nakamura, Osamu Imafuji, Masaaki Yuri | 2003-05-20 |
| 6562644 | Semiconductor substrate, method of manufacturing the semiconductor substrate, semiconductor device and pattern forming method | Masahiro Ogawa, Masaya Mannoh, Masaaki Yuri | 2003-05-13 |
| 6563140 | Semiconductor light emitting device and method for producing the same | Shinji Nakamura, Masaaki Yuri, Osamu Imafuji, Kenji Orita | 2003-05-13 |
| 6562701 | Method of manufacturing nitride semiconductor substrate | Daisuke Ueda, Masaaki Yuri | 2003-05-13 |
| 6525523 | Jitter measurement apparatus and its method | Mani Soma, Takahiro Yamaguchi, Toshifumi Watanabe | 2003-02-25 |