Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6650583 | Test circuit device capable of identifying error in stored data at memory cell level and semiconductor integrated circuit device including the same | Katsumi Dosaka | 2003-11-18 |
| 6643214 | Semiconductor memory device having write column select gate | Yasuhiko Taito, Takeshi Fujino | 2003-11-04 |