Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646752 | Method and apparatus for measuring thickness of a thin oxide layer | Tung-Li Lee, Bing Huei Perng, Chao Po Leu | 2003-11-11 |
PC
Pu Chen
Overall (2003): #139,421 of 273,478Top 55%
1
Patents 2003