Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6591681 | Nondestructive inspection apparatus for inspecting an internal defect in an object | Takashi Shimada, Shinichi Hattori, Takahiro Sakamoto | 2003-07-15 |
SN
Syuichi Nakamura
Overall (2003): #111,512 of 273,478Top 45%
1
Patents 2003