YC

Yoel Cohen

NI Nova Measuring Instruments: 1 patents #5 of 12Top 45%
Overall (2003): #87,561 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6643017 Method and system for controlling the photolithography process Moshe Finarov 2003-11-04