EY

Eiji Yonezawa

NC Nidek Co.: 2 patents #4 of 53Top 8%
📍 Ebeye: #44 of 404 inventorsTop 15%
Overall (2003): #68,888 of 273,478Top 30%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6621568 Defect inspecting apparatus 2003-09-16
6556291 Defect inspection method and defect inspection apparatus 2003-04-29