YT

Yukihiro Tanaka

JE Jeol: 1 patents #4 of 28Top 15%
NE Nec: 1 patents #355 of 1,409Top 30%
Overall (2003): #34,562 of 273,478Top 15%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6653629 Specimen inspection instrument Sadao Matsumoto, Toru Ishimoto, Hirofumi Miyao 2003-11-25
6507878 Bus snoop control circuit 2003-01-14