KN

Kiyoshi Nikawa

NE Nec: 1 patents #355 of 1,409Top 30%
NE Nec Electronics: 1 patents #54 of 322Top 20%
Overall (2003): #56,536 of 273,478Top 25%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6610918 Device and method for nondestructive inspection on semiconductor device 2003-08-26
6593156 Non-destructive inspection method 2003-07-15