DN

Dinesh Nair

NI National Instruments: 3 patents #2 of 36Top 6%
📍 Bengaluru, TX: #1 of 7 inventorsTop 15%
Overall (2003): #31,604 of 273,478Top 15%
3
Patents 2003

Issued Patents 2003

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6665066 Machine vision system and method for analyzing illumination lines in an image to determine characteristics of an object being inspected Kevin L. Schultz 2003-12-16
6615158 System and method for analyzing a surface by mapping sample points onto the surface and sampling the surface at the mapped points Lothar Wenzel, Ram Rajagopal 2003-09-02
6535640 Signal analysis system and method for determining a closest vector from a vector collection to an input signal Ram Rajagopal, Lothar Wenzel 2003-03-18