JL

John Lam

NT N&K Technology: 1 patents #1 of 4Top 25%
📍 Oakville, CA: #20 of 83 inventorsTop 25%
Overall (2003): #192,506 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6594025 Method of monitoring thin-film processes and metrology tool thereof Abdul Rahim Forouhi, Dale A. Harrison, Eric Maiken 2003-07-15