Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6593738 | Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors | David Margulis, Elik Gershenzon | 2003-07-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6593738 | Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors | David Margulis, Elik Gershenzon | 2003-07-15 |