Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6509198 | Method of power IC inspection | Jen-Te Chen | 2003-01-21 |
| 6506615 | Method for measuring the depth of well | Jen-Te Chen | 2003-01-14 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6509198 | Method of power IC inspection | Jen-Te Chen | 2003-01-21 |
| 6506615 | Method for measuring the depth of well | Jen-Te Chen | 2003-01-14 |