YZ

Yuwu Zhang

MI Mitutoyo: 2 patents #16 of 109Top 15%
MC Mori Seiki Co.: 1 patents #11 of 32Top 35%
OK Okuma: 1 patents #5 of 11Top 50%
UN Unknown: 1 patents #273 of 2,925Top 10%
Overall (2003): #34,493 of 273,478Top 15%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6611786 Apparatus and method concerning analysis and generation of part program for measuring coordinates and surface properties Masayoshi Uneme, Yasushi Fukaya, Kazuo Yamazaki 2003-08-26
6510725 Apparatus and method of inspecting gage Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda 2003-01-28