Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6546640 | Traverse linearity compensation method and rotational accuracy compensation method of measuring device | Eiji Okada, Atsushi Tsuruta, Tsukasa Kojima | 2003-04-15 |
| 6526364 | Method and apparatus for measuring roundness | Ryosuke Watanabe, Atsushi Tsuruta, Syuuzou Ueno, Hideki Shindo | 2003-02-25 |