Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6570390 | Method for measuring surface leakage current of sample | Taisei Hirayama, Koichiro Ito, Ryo Hattori, Yoshihiro Notani, Shinichi Miyakuni | 2003-05-27 |
YY
Yoshitsugu Yamamoto
Rigaku: 1 patents #1 of 12Top 9%
Overall (2003): #85,191 of 273,478Top 35%
1
Patents 2003