Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6551847 | Inspection analyzing apparatus and semiconductor device | Kyoko Asahina, Kaoru Yamana | 2003-04-22 |
| 6528334 | Semiconductor inspection system, and method of manufacturing a semiconductor device | Mariko Mizuo | 2003-03-04 |